Abstract
High-quality epitaxially grown (Pb,La)(Zr,Ti)O3 (PLZT) films were successfully fabricated on single-crystalline sapphire (012) substrates using a modified sol–gel process. The crystallographic relationship between the PLZT film and the sapphire substrate, and the detailed electro-optic (EO) properties of the films were investigated. Large linear EO coefficients, as large as 510 pm/V, were obtained when an electric field was applied at a 45° angle to the PLZT {110}. In turn, smaller EO coefficients were obtained when an electric field was applied at 0° and 90° angles to the PLZT {110}. A strong EO anisotropy was observed according to the configuration of the input light polarization and the applied electric field.
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