Electronic structure of single crystal UPd 3, UGe 2, and USb 2 from hard X-ray and angle-resolved photoelectron spectroscopy

Abstract

Electronic structure of single crystal UPd 3, UGe 2, and USb 2 has been measured from hard X-ray photoelectron spectroscopy (HAXPES) with 7.6 keV photons at the European Synchrotron Radiation Facility (ESRF). Lower photon energy angle-resolved photoelectron spectroscopy (ARPES) was also performed at the Synchrotron Radiation Center (SRC). Herein the following results are presented: (i) ARPES results demonstrate hybridization between the U 5f and Pd 4d electrons within UPd 3. (ii) The greatly reduced surface sensitivity of HAXPES enabled observation of the bulk core levels in spite of surface oxidation. Photoelectron mean-free-path versus oxide layer thickness considerations were used to model the effectiveness of HAXPES for probing bulk features of in-air cleaved samples. (iii) Two distinct features separated by 800 meV were observed for the Sb 3d core level. These two features are attributed to manifestations of two distinct Sb sites within the USb 2 single crystal as supported by consideration of interatomic distances and enthalpy-of-formation. (iv) Doniach–Sunjic line shape analysis of core level spectral features revealed correlations between asymmetry coefficients and 5f localization.