Abstract
The interface electronic structure of a bilayer heterojunction of C60 and three different phthalocyanines grown on indium tin oxide (ITO) has been studied using synchrotron radiation-excited photoelectron spectroscopy. The energy difference between the highest occupied molecular orbital level of the phthalocyanine (donor) layer and the lowest unoccupied molecular orbital level of the C60 (acceptor) layer (EHOMOD − ELUMOA) was determined. The EHOMOD − ELUMOA of a heterojunction with boron subphthalocyanine chloride (SubPc) was found to be much larger than those of copper phthalocyanine (CuPc) and chloro-aluminum phthalocyanine (ClAlPc). This observation is discussed in terms of the difference of the ionization energy of each donor material. Additionally, we have studied the molecular orientation of the phthalocyanine films on ITO using angle-dependent X-ray absorption spectroscopy. We found that the SubPc films showed significant disorder compared to the CuPc and ClAlPc films and also found that EHOMOD − E...
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