Abstract
The electron spin resonance and transport properties of microcrystalline silicon were investigated. Identification and location of the resonance states in the material are discussed. We analyse the properties of the conduction electron resonance and the relation of the corresponding states with electronic transport. Conduction band tail states within the crystalline regions of the material are proposed as a requirement for the interpretation of the experimental results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
