Abstract
ABSTRACTDefect accumulation behavior in Fe irradiated with high energy (∼100MeV) ions, low energy (∼1MeV) ions and 2MeV electrons was studied by measuring the electrical resistivity change of the specimen at ∼80K as a function of particle fluence. From the experimental results, the defect production cross-section, the defect annihilation cross-section and the damage efficiency (the ratio of the experimental defect production cross-section to the calculated one) were derived for each irradiation. By comparing the results for high energy ion-irradiations with those for low energy ion- and electron-irradiations, the dependence of defect production and radiation annealing on the electronic excitation is discussed.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
