Abstract
High resolution transmission electron microscopy, conventional transmission electron microscopy and selected area electron diffraction were applied to single crystalline thin tellurium films, which were vacuum deposited on cleaved NaCl surfaces. For the first time tellurium could be deposited as single crystalline films on rocksalt. The thin films grew with the plane (100) or (110) parallel to the substrate. The thickness of the films was 200–800 Å.
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