Abstract
In this paper, we apply a theoretical model developed by Plenkiewicz et al. for analyzing the current I t transmitted by an ultrathin dielectric film as a function of incident electron energy E for solid argon. The analysis of I t ( E) in the elastic scattering region (0–12 eV) allows one to determine the electronic conduction-band density of states and to calculate the electron scattering mean free path as a function of energy. Comparison of our results with various solid argon band structure calculations is also presented.
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