Abstract
An electron-scattered ion/atom coincidence technique has been developed and applied to the interaction of 3 keV He + ions with a Si(1 0 0)–(2 × 1)-H surface. The technique extends scattering and recoiling imaging spectrometry (SARIS) to include electron-scattered particle coincidence methods. The distributions of the scattered projectiles (He 0 and He +) on a position-sensitive detector in the range of large scattering angles and in coincidence with the emitted electrons have been measured. The results allow separation of the scattered atom or ion flux from different surface layers and their contributions to the total scattered flux.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
