Abstract
Using the electron holography principle, a coherent field-emission electron beam is employed to quantitatively measure to a precision of 2π/100 the phase distribution of an electron wave function transmitted through or reflected from a sample. This technique opens up the possibility of previously impossible high-precision measurements such as the quantitative measurement of magnetic lines of force in a microscopic region, and thickness measurement in atomic dimensions.
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Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
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