Abstract
We have determined the recombination diffusion length of electrons in Cu x S generated by light in standard wet-dip sol CdS Cu x S solar cells. The recombination diffusion lengths were determined from measurements of the relative variation in short-circuit current with wavelength. For cells with a copper sulfide thickness of 0.2–0.3 μm diffusion lengths ranged from 0.08 to 0.26 μm. No significant changes in diffusion length were measured after various cell heat treatments in air and hydrogen even when large changes in the short-circuit current occurred.
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