Abstract
The conditions of phase formation in the Tl-Fe-Se system and the crystallization kinetics of amorphous TlFeSe2 films are investigated by electron-diffraction structural analysis and kinematic electronography. It is shown that the crystallization of amorphous TlFeSe2 films is described by the analytical expression of kinetic phase-transformation curves Vt = V0[1 − exp(ktm)]. The growth dimensionality during the crystallization of amorphous TlFeSe2 equal to three and the activation energies of nucleation and crystal growth are determined.
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