Abstract
The characteristics of two single-crystal YAG-based slow-scan CCD (SSC) cameras are measured and analyzed for various electron accelerating voltages. A stream-lined procedure for characterizing electron cameras is described, especially, the procedures for the measurement of modulation transfer function (MTF) and detector quantum efficiency (DQE). The limiting factors on the DQE of the SSC camera are studied, and possible improvements in the design are discussed. These analyses should be useful for the future improvement and optimization of SSC cameras for specific applications.
Published Version
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