Abstract
The evolving magnetism and electronic structure at the Ni/Co interface have been studied using x-ray absorption spectroscopy (XAS) and x-ray photoemission spectroscopy (XPS) with circularly polarized x rays. Deposition of ultrathin Ni films on thin films of Co grown on Cu(001) results in an intensity enhancement across the Co L2.3 absorption edge. By comparison, the intensity of the Ni L2.3 edge decreases as a function of Ni film thickness. The relative changes in the Ni and Co XAS intensities are interpreted as an electronic charge transfer from the Co to the Ni. Distinct changes in the Co 2p XAS and XPS line shapes after addition of the Ni overlayer imply a modification of the Co 3d electron correlation due to the charge transfer. The change in the electronic structure is related to the interface magnetism using magnetic circular dichroism sum rule analysis.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
