Abstract
AbstractA comprehensive understanding of the interaction between electron beams and carbon nanotubes (CNTs) in scanning electron microscope (SEM) can be challenging due to the complex surface charging behavior and various nanostructures formed by CNTs. Herein, an overview of the challenges and potential solutions are provided for achieving high‐resolution imaging of nanomaterials, such as CNTs, in SEM systems. First, imaging mechanisms of CNTs on conducting, insulating, and hybrid substrates are summarized, with morphology, material type, and charging effect covered. Second, measuring the conductivity, bandgap, and diameter of a CNT by SEM method is introduced. Finally, the utilization of super‐aligned CNT (SACNT) films for observing insulators and vertically aligned CNT arrays (VACNTAs) as electron blackbodies are discussed separately. New techniques for imaging and characterizing nanostructures will ultimately lead to the advancement of CNT‐based technologies.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
