Electron backscatter diffraction of Nb3Sn coated niobium: Revealing structure as a function of depth

Abstract

Over the last two decades, advances in Electron Backscatter Diffraction (EBSD) have moved the technique from a research tool to an essential characterization technique in many fields of material research. EBSD is the best suited technique for determining structure as a function of depth. This characterization is critically important but has been previously absent from Nb3Sn efforts. While EBSD is the technique of choice, obtaining quality data can be difficult. Sample preparation in particular is nontrivial. Here, we summarize the general principles of EBSD, discuss specific sample preparation techniques for Nb3Sn coated SRF cavity materials, and give examples of how EBSD is being used to understand fundamental growth mechanisms for Nb3Sn coatings.