Challenges in EBSD characterization of heterogeneous microstructure in additively manufactured alloys

Abstract

Electron Backscatter Diffraction (EBSD) in Scanning Electron Microscope (SEM) has been one of the most popular tools for characterizing microstructures of materials and in particular alloys made by additive manufacturing (AM) in recent years. This characterization technique can provide abundant microstructural data, including phase distribution, grain size, grain boundary character, crystallographic orientation, and texture. However, it has recently been noticed that there are several challenges in the characterization of AM alloys by EBSD, causing the misunderstanding of material microstructures. This presentation discusses two challenges associated with the grain size determination by EBSD. Grain size is an important parameter used in understanding the relationship between the mechanical property and microstructure of a 3D-printed alloy, and is usually measured by optical microscope (OM) and EBSD. However, a common issue is that the grain size determined by EBSD sometimes is inconsistent with that from OM. Here We measured the grain size from the same areas in a Ti64 sample by OM and EBSD, respectively, and compared the results, in order to correlate two techniques. The result shows that when the grain size is greater than 10um, the data from OM and EBSD can completely match. When the grain size is in the range of 4~10um, there is a significant deviation between the size distributions. For fine grains, e.g. <4um, the EBSD measurement is more reliable. This indicates that OM and EBSD are equivalent for analyzing grains which sizes are bigger than 10um, but EBSD is more suitable for measuring fine grains due to the higher spatial resolution than OM. Further analysis reveals that the accuracy of grain size measurement especially for the fine grains is strongly related to the threshold angle of grain boundary used in the EBSD data process. Step size is another important parameter to determine the grain size. Another usual challenge in the EBSD analysis is how to choose the step size to obtain a high-quality EBSD map with high spatial resolution and high hit rate [1]. As the typical AM alloy has two different microstructural features in terms of grain size, melt pools with large columnar grains and fine-grained regions between the melt pools, researchers like to choose a small step size to map the sample. This is a conventional EBSD strategy used in the characterization of heterogeneous microstructures in materials. However, the recent characterization in Al printed alloys shows that such a strategy doesn’t work well at low magnification even a very small step size is used. Normally, grains in melt pools are visualized and measured well, but the fine grains at the melt pool boundaries are invisible at the low magnification due to the low hit rate. To improve EBSD map quality and grain size measurement at the fine-grained regions, higher magnification with a smaller step size has been used, but this condition limits the size of the mapping area. Compromising the magnification and grain size determination, a new EBSD strategy that includes two steps of mapping AM samples is recommended, firstly scanning a big area to show the domain microstructures of melt pools, and secondly mapping with higher magnification to show the typical fine-grained region in detail.