Abstract
Thin Ti–Au films on sapphire were powered using pulsed dc. The incidence of electromigration damage is a complex function of pulse duration and repetition rate. For a given total ``exposure'' (fixed current density for a fixed total on-time) the damage may be reduced or eliminated by using duty cycles less than 100%.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
