Electromagnetic susceptibility analysis in device level with numerical technique based on electric field integral equation

Abstract

With the advance in high-speed electronics and the presence of new standards on electromagnetic susceptibility, EMS analysis and evaluation is becoming increasingly important. This paper investigates EMS of shielded electronic equipment in the device level by using a full-wave numerical technique combined with a circuit-based method. The method of moments in terms of the mixed-potential electric field integral equation for the geometries of arbitrary combined wire/surface is developed for susceptibility evaluation. With numerical analysis, the effect of external EM noise on electronic equipment is characterized and an equivalent secondary source model is extracted for further EMS analysis of internal high-speed susceptible circuits at a lower board level.