Abstract

In this paper, the stochastic integral equation method (SIEM) is proposed to calculate the electromagnetic scattering from the one-dimensional Gaussian rough surface. In the SIEM, the statistical parameters of the Gaussian rough surface are firstly included in the Green’s function. And the new Green’s function is used to get the new integral equation. Then the method of moments is applied to solve the new integral equation. The accuracy of the SIEM is shown by comparing with the statistical average of multiple samples through the Monte Carlo method. And, the sample of the Gaussian rough surface is not needed to simulate in the SIEM.

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