Abstract
We describe a method for preparation of crystalline silver telluride films by cathodic deposition from dimethyl sulfoxide (DMSO) solutions containing 0.1 M NaNO 3, 5.0 mM AgNO 3 and 3.5–7.0 mM TeCl 4. X-ray diffraction data indicated that the deposited silver telluride films could be adjusted from Ag excess and stoichiometric monoclinic Ag 2Te to hexagonal Ag 7Te 4 by increasing the concentration of TeCl 4 in the electrolyte or lowering the deposition potential. The Ag 2Te film is gray and the Ag 7Te 4 film is dark blue-gray and mirror like adhered strongly to the substrates. Scanning electron microscopy images show that Ag 2Te films were formed with globular grains with average diameters of more than 1 μm. In contrast, Ag 7Te 4 film consists of triangles characteristic of a (1 1 1) single-crystal with a hexagonal structure in average sizes of about 0.4 μm. The X-ray photoelectron spectra (XPS) indicated that the binding energies deviation of Te3d in Ag 7Te 4 is less than that in Ag 2Te, which is consistent with the apparent valences of Te in Ag 2Te and Ag 7Te 4. Finally, the cathodic deposition reactions were studied by cyclic voltammetry.
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