Abstract
The electrochemical oxidation of dense Mn films is shown to occur through the following sequence of oxides: Mn to MnO to to to . X-ray photoelectron spectroscopy analysis reveals that at each stage, the manganese exists as a hydrated compound. Complete oxidation was shown to be necessary to maintain high capacitance values when utilized as a redox supercapacitor. Partial oxidation was shown to reduce the amount of present in the film and the relative surface area of the film, thus having a negative effect on the capacitance. Efforts to improve the hydration of the films oxidized to using a dual current oxidation proved unsuccessful.
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