Abstract

We show that nanometer and sub-nanometer scale defects in two-dimensional transition metal dichalcogenides can be detected electrochemically using scanning electrochemical cell microscopy (SECCM). We detect isolated anomalous electrochemical responses for the hexaammineruthenium ([Ru(NH3)6]3+/2+) redox couple on mono-, bi-, and trilayer regions of mechanically exfoliated MoS2. These anomalous sample points display faster electrochemical kinetics, with a diffusion-limited current plateau, compared to the surrounding sample points. The analysis of the electrochemical current suggests that the defects are equivalent to disk-shaped defects with radii of tens of nanometers, or to one-dimensional defects with nanometer to sub-nanometer widths. These results demonstrate that we can effectively isolate and electrochemically amplify the response from individual defects on a sample surface using SECCM, revealing features below the optical diffraction limit that would normally require high-resolution electron microscopy or scanning tunneling microscopy to detect.

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