Abstract
We have investigated the electrochemical properties of V 2O 5-based thin film electrodes as a function of the amount of MoO 3 by means of X-ray diffraction (XRD), X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM). XRD results show that the V 2O 5-based thin film electrodes give an amorphous characteristic. XPS results reveal the formation of V 2O 5 and MoO 3 phases. TEM results show that MoO 3 dots (5–30 nm in size) are embedded in the amorphous V 2O 5 matrix. It is further shown that cells fabricated with the MoO 3–V 2O 5 nanocomposite thin film electrodes give better cycling performance than those made with the single V 2O 5 thin film electrodes. A possible explanation for the MoO 3 nano-dot dependence on the cycling performance of the V 2O 5-based thin film electrodes is described.
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