Abstract
Temperature-dependent Hall effect measurements are reported on a series of nitrogen doped ZnSe and ZnTe epilayers using a van der Pauw configuration. A Zn(Se,Te) pseudo-graded band gap layer was used to form ohmic contacts to p-type ZnSe. The activation energy of nitrogen in ZnSe at the infinite dilution limit was extrapolated to be 114 meV. For a ZnTe film having a room temperature free hole concentration of p = 4.1 x 1016 cm−3, the activation energy of the nitrogen acceptors was found to be 46 meV.
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