Abstract
Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV ∝ V), whereas the latter is characterized by a nonlinear dependence, dI/dV ∝ V3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices.
Highlights
An ideal graphene is a monatomic layer of carbon atoms arranged on a honeycomb lattice
Our work demonstrates the importance of contact geometry in graphene-based electronic devices
The Auger spectra taken from regions (i) and (ii) resembles closely the Auger spectra of few layer graphene reported by Xu at al.,[18] while that of region (iii) is dominated by peaks associated with copper
Summary
An ideal graphene is a monatomic layer of carbon atoms arranged on a honeycomb lattice. Experimental and theoretical studies have shown that both the nature of atomic bonding at the metal-graphene interface and band structure of graphene near the Fermi level play crucial roles in determining the transport properties of M-G junctions.[9,10,11,12,13] Here, we demonstrate that, in addition to the type of contact materials and corresponding nature of atomic bonding between metal and graphene, the contact geometry, i.e., an edge- or side-contact,[14] plays an important role in electron transport across the M-G junctions
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