Abstract
Nanocrystalline copper samples have been prepared in an opposed-targets sputtering (OTS) system, and the dc resistivity of such samples has been measured and analyzed. The results show that nanocrystalline copper samples have a much higher resistivity and a larger temperature dependence of the resistivity than bulk copper. These features can be understood by grain-boundary-enhanced scattering of electrons. The coefficient of electron reflection by grain boundaries in a nanocrystalline copper sample and its temperature dependence have been deduced and are discussed.
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