Abstract
We have measured the resistivity, temperature coefficient of resistivity (TCR) and grain sizes in single films of Cu and Nb as a function of film thickness. We have compared our experimental results with the predictions of the theory due to Dimmich. This theory allows us to extract a value for grain boundary reflectivity, R, which is subsequently used in the analysis of the resistivity and TCR of Cu/Nb multilayers. We present our values for grain boundary reflectivity and the subsequent fit to the experimental resistivity and TCR using Dimmich's equations.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
