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https://doi.org/10.1088/0022-3727/15/12/019
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Cite Publication Date: Dec 14, 1982 | |
 Citations: 4 |
Affiliation: Sardar Patel University
The electrical resistivity of vacuum deposited chromium-copper alloy films has been measured and compared with the values calculated using Fuchs-Sondheimer theory. It is observed that the resistivity can be explained assuming diffuse scattering with an electron mean free path of 376 AA.
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