Abstract
Observations of 180° domain patterns were made on a bulk BaTiO3 single crystal using atomic force microscopy and piezoresponse force microscopy (PFM). Surface electrodes were then used to apply a weak in-plane electric field, and in-situ measurements of electrical creep induced domain structure evolution were made. The out-of-plane electric field component presented by electrodes was insufficient to cause significant switching alone. However, in the presence of the scanning PFM tip, a gradual change in 180° domain configuration was observed. This suggests that by combining in-plane fields with an out-of plane bias, domain configurations can be manipulated at the surface of bulk crystals using low voltages.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
