Abstract
Electrical conductivity of bull amorphous V2O5 obtained by splat cooling is measured in the temperature range 360 to 150 K. A continuous decrease of the activation energy W deduced from a plot of In (σT) vs. T−1 is observed in the whole range. Such a behaviour is typical of small polaron hopping in amorphous transition metal oxides. The temperature dependence of the electrical conductivity is analyzed according to two different models. The first one describes the structural disorder as a random distribution of the potentials while the second one, suggested by Killias, takes into account a random distribution of the hopping distances. Both models agree with the experiments and yield values in good agreement with previous results obtained with amorphous V2O5 thin films and V2O5 based glasses.
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