Abstract
AC and DC conduction in MIM sandwich structures based on SiO/CeO2 as a dielectric prepared by the co-evaporation technique has been investigated before and after electroforming for different compositions. The electroformed samples show voltage-controlled negative resistance (VCNR), voltage-memory, thermal-voltage-memory and pressure-voltage-memory effects and the results are explained in terms of the filamentary model of electrical conduction. The positive electrode was investigated using a scanning electron microscope to observe the effects of electroforming and the liberation of gas as a result of the application of high electric fields
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
