Abstract
An investigation of the electrical characteristics of ultrathin ZrO2 formed by anodization in an ammonium tartrate electrolyte is reported. Compared with low temperature thermal oxidation, the formation of zirconium oxide by anodization shows self-limiting oxidation behavior with an increase in time, and, thus, provides superior control of the oxide thickness. The growth of anodized oxide inhibits aggressive oxidation by blocking the flow of current through a dielectric since the location at which the oxide forms would become a region of high resistance. The equivalent oxide thickness of ultrathin zirconium oxide by anodization within an acceptable dispersion was scaled down to 11.4 Å with leakage current density of less than 1.5×10−3 A/cm2 at Vfb of −1 V. The density of the interface state and fixed charge density of zirconium oxide using the anodization process are also discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.