Abstract
Despite a growing interest in graphene, an aspect which is less studied is the electrical and optical characterization of graphene oxide (GO)-based transparent conductors obtained using thermal annealing. In addition, few research works have studied the electrical properties of GO and reduced graphene oxide (RGO) films using electrical impedance measurements. In this study, electric impedance measurements are performed on GO and thermally reduced GO films dip-coated on glass substrates. The electric resistance of RGO films decreases by about two orders of magnitude compared to GO films. Moreover, optical microscopy and variable angle spectroscopic ellipsometry (VASE) were carried out on the same samples. Thermal annealing increases the optical conductivity and the absorption coefficient of GO films. Such findings could be used in many optoelectronic applications, improving future GO applicability.
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