Abstract
The transport properties of Mg doped and undoped InN films are studied with capacitance-voltage, thermopower, and Hall mobility measurements. A positive Seebeck coefficient is observed for Mg doped InN confirming p-type conductivity, though high doping and structural defect density can lead to n-type films. Transport measurements of undoped films are analyzed employing Rode's iterative Boltzmann equation method. Observed thermopower, Hall mobility, and dislocation density data for undoped films are consistent with calculations including the effects of charged line defect (donor-type dislocation) scattering.
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