Abstract
La0.7Sr0.3MnO3 (LSMO) polycrystalline thin films were deposited respectively on (Pb0.97La0.02)(Zr0.58Sn0.3025Ti0.1175)O3 (PLZST) ceramics and Si wafer by RF magnetron sputtering. Their microstructure, electric transport and magnetic properties were investigated. Compared with the LSMO thin films on Si, the films on PLZST show excellent electrical and magnetic transport properties. The resistivity of LSMO on PLZST reduced obviously compared to that of LSMO on Si. The LSMO films on PLZST show higher Curie temperature and metal-insulator transition temperature (TC=340K, TMI=260K). Meanwhile, the magnetoresistance exhibits excellent thermal stability in a broad temperature range even under 6T magnetic field.
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