Abstract
Textured (K0.44Na0.52Li0.04) (Nb0.86Ta0.10Sb0.04)O3 thick film was fabricated by the screen printing method with plate-like NaNbO3 particles as template. Thick film with 75% grain orientation was prepared. Remnant polarization and coercive field observed from the P–E loops of textured thick film were 3.6 μC cm−2 and 21 kV cm−1, respectively. Textured (K0.44Na0.52Li0.04) (Nb0.86Ta0.10Sb0.04)O3 thick film exhibited diffusion behaviour by analysing the temperature dependence of permittivity and loss tangent. The result of leakage current density showed a conduction mechanism of Schottky emission. Piezoelectric (PZT) properties of the thick film were characterized by the relationship of unipolar strain and applied electric field and the PZT constant \(\phantom {\dot {i}\!} {d}_{{33}}^{{\ast }}\) of textured thick film reached to 150 pm V−1. Nonlinear PZT property of the thick film was investigated by Rayleigh law.
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