Abstract
We have investigated the electric field effects in low resistance perpendicular magnetic tunnel junction (MTJ) devices and found that the electric field can effectively reduce the coercivity (Hc) of free layer (FL) by 30% for a bias voltage Vb = −0.2 V. In addition, the bias field (Hb) on free layer is almost linearly dependent on Vb yet independent on the device size. The demonstrated Vb dependences of Hc and Hb in low resistance MTJ devices present the potential to extend the scalability of the electric field assisted spin transfer torque magnetic random access memory and improve its access speed.
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