Abstract
We report the results of electric field influence on holographic recording in verythin chalcogenide glass films. The total internal reflection prism recordingtechnique (Stetson’s scheme) is applied for holographic recording. The mainadvantage of this scheme is the possibility of holographic recording in micro- andnanometer thick photosensitive materials. In the present work, 30 nm, 50 nm and1.0 µm thick films areused. In the 1.0 µm thick film two slanted gratings are simultaneously recorded. In this recording geometry onlyone reconstructed beam is observed. The corona charging influence on the diffractionefficiency of the recorded gratings is investigated. A negative voltage of 5 kV isapplied to the corona electrode (needle) prior to the holographic recording. Theobserved diffraction efficiency of charged samples is always higher in comparison withuncharged samples. The reconstructed beam intensity is monitored with a red(635 nm) semiconductor laser. The possible reason is an additional refractive indexmodulation due to the increase in polarization, caused by the electric charging.
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