Abstract
A low frequency anomaly of the electric capacitance occurring in the vicinity of the superionic phase transition temperature Tsi and often interpreted as a dielectric anomaly is discussed. Analysis of the results of electric impedance measurements for (NH4)4H2(SeO4)3 and the results of direct capacitance measurements near Tsi prove that the anomaly is caused by double layer electrode effect. The layers are formed by the ionic flow through the sample. The abrupt increase of the ionic conductivity at the superionic phase transition causes a sudden lowering of the frequency at which the anomaly appears. Eine Anomalie der elektrischen Kapazitat bei niedrigen Frequenzen in der Nahe der superionischen Phasenubergangstemperatur tsi, oft als dielektrische Anomalie interpretiert, wird diskutiert. Die Analyse der Ergebnisse elektrischer Impedanzmessungen an (NH4)4H2(SeO4)3 und der Ergebnisse direkter Kapazitatsmessungen in der Nahe von Tsi beweisen, das die beobachtete Anomalie das Ergebnis der Bildung einer Elektroden-Doppelschicht ist. Diese Schicht wird vom Ionenflus durch die Probe verursacht. Der abrupte Anstieg der Ionenleitfahigkeit beim superionischen Phasenubergang bewirkt eine abrupte Erniedrigung der Frequenz, bei der die Anomalie auftritt.
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