Abstract
A single multiwall carbon nanotube was bridged between platinum and indium–gallium (In–Ga) alloy electrodes in a transmission electron microscope, and electric resistances between the electrodes at various bridge lengths were measured in situ with the imaging of the structural dynamics of the nanotube. The intrinsic resistivity of the nanotube and the contact resistances between the nanotube and the electrodes were analyzed, and the resistivity of the nanotube was estimated to be 3.8 ×10-4 Ω cm. At a high current exceeding about 120 µA with the In–Ga alloy electrode being positively biased, the alloy material migrated along the nanotube surface toward the counter electrode.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
