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https://doi.org/10.1109/emceurope.2008.4786826
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Cite Publication Date: Sep 1, 2008 |
 Citations: 2 |
Affiliation: Universitat Politècnica de Catalunya
In this article we present measurements of electric and magnetic fields in industrial environments. A frequency selective probe to measure E and H fields simultaneously has been used. The probe, implemented on a printed circuit board, allows us to measure the spatial distribution of the fields.
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