Abstract
We have performed surface acoustic wave (SAW) measurements to examine vacancies in a surface layer of a boron-doped silicon wafer currently used in semiconductor industry. A SAW with a frequency of fs = 517 MHz was optimally generated by an interdigital transducer with a comb gap of \(w=2.5\) µm on a piezoelectric ZnO film deposited on the (001) silicon surface. The SAW propagating along the [100] axis with a velocity of \(v_{\text{s}}=4.967\) km/s is in agreement with the Rayleigh wave, which shows an ellipsoidal trajectory motion in the displacement components ux and uz within a penetration depth of λp = 3.5 µm. The elastic constant Cs of the SAW revealed the softening of ΔCs/Cs = 1.9 × 10−4 below 2 K down to 23 mK. Applied magnetic fields of up to 2 T completely suppress the softening. The quadrupole susceptibilities based on the coupling between the electric quadrupoles Ou, Ov, and Ozx of the vacancy orbital consisting of Γ8–Γ7 states and the symmetry strains eu, ev, and ezx associated with the SAW ac...
Published Version
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