Abstract
Scattering of a quasi-monochromatic electron beam emitted by an extended source by a crystal is described with the use of the mutual coherency function and formalism Bloch waves. An expression correlating the mutual intensities on the exit and entrance surfaces of the crystal under partially coherent illumination is obtained. The case of illumination by an effective incoherent source filling the condenser aperture is considered. The effect of coherence of an incident beam on the intensity distribution in electron-microscopy images has been studied. For a wedge-shaped crystal, intensity profiles of a transmitted electron beam in images obtained at different values of incident-beam divergency and defocusing of the objective lens have been calculated.
Published Version
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