Efficient data averaging for spin noise spectroscopy in semiconductors

Abstract

Spin noise spectroscopy (SNS) is the perfect tool to investigate electron spin dynamics in semiconductors at thermal equilibrium. We simulate SNS measurements which utilize real-time fast Fourier transformation instead of an ordinary spectrum analyzer and show that ultrafast digitizers with low resolution enable surprisingly sensitive, high bandwidth SNS in the presence of strong optical background shot noise. The simulations reveal that optimized input load at the digitizer is crucial for efficient spin noise detection while the resolution of the digitizer, i.e., the bit depth, influences the sensitivity rather weakly.