Efficient BIST schemes for RNS datapaths

Abstract

It has recently been shown that accumulators can be used efficiently for test pattern generation as well as for test response compaction. In this paper we present a BIST scheme for accumulators where the accumulator is simultaneously used as a test pattern generator and a response compactor during its own testing. We also show that the proposed BIST scheme is especially suitable for accumulator, adder and multiplier-accumulator RNS channels leading to minimal hardware overhead and short test sequences.