Abstract
In this brief, a new multivariate statistical method based on structured low-rank representation (SLR) is proposed to detect minor faults for industrial process monitoring (PM). The core idea of the proposed SLR is to enhance the representation of minor faults by using the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\ell _{2,0}$ </tex-math></inline-formula> -norm, and improve the robustness to noise by introducing a regularization term. Further, a learnable manifold constraint is incorporated to preserve the cause-effect relationship between monitoring variables. More importantly, a distributed optimization algorithm is developed with convergence analysis. Simulation examples are conducted to demonstrate the effectiveness and robustness of the proposed PM method.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Circuits and Systems II: Express Briefs
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
