Abstract
In this work, the dislocation-related efficiency droop in InGaN/GaN blue light-emitting diodes (LEDs) was investigated by comparing the external quantum efficiency (EQE) of GaN grown on c-plane sapphire and free-standing GaN substrate over a wide range of operation conditions. The values of A, B, and C coefficients had been iteratively obtained by fitting quantum efficiency in the rate equation model. Analysis revealed that threading dislocation density was strongly related to the decrease in EQE of InGaN LEDs at elevated currents by introducing a number of acceptor-like levels with the energy EA lying within the band gap.
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