Efficacy of differential phase extraction methods in dual atom interferometers under correlated noise conditions

Abstract

Atom interferometry-based sensors have demonstrated remarkable precision, making them attractive for diverse applications compared to traditional sensors. However, practical experiments inevitably encounter noise, which limits precision. We investigate the performance of two commonly used methods, ellipse fitting (EF) and fringe fitting (FF), for differential phase estimation in a dual atom interferometer under various noise conditions. We comprehensively analyze the efficacy of these methods for each type of Gaussian noise, including phase noise, amplitude noise, and offset noise. Using a colored noise model, we investigate the Allan deviation results. Our investigations will offer valuable insights for future quantum sensing based on dual interferometers.