Abstract
Abstract In this paper, we studied the effects of ion irradiation and annealing treatment on the ZnO thin films. ZnO thin films were first prepared on sapphire substrate by rf-magnetron sputtering technique, followed by nitrogen ion irradiation and annealing treatment. The crystallographic properties, surface morphology and optical properties changed after nitrogen ion irradiation and annealing treatment, which were investigated by X-ray diffraction, scanning electron microscopy and absorption spectroscopy.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.