Abstract
Rutherford backscattering spectroscopy (RBS) technique with computer simulations are developed for numerical analysis of the level-by-level element composition of rapidly solidified foils of the Al–Mn alloy. It has been obtained that the manganese depth distribution in the foils is irregular in the near-surface region of the samples. Thin surface layer (0.03 μm) is impoverished by manganese in a substrate region. Depth-dependent elemental composition of the foils remains constant after annealing at 200 °C. The manganese content of surface layer grows with increasing of annealing temperature. A correlation of dope depth profiles and both phase composition and surface of analysis of the annealed foils is observed.
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